{"id":6039,"date":"2017-10-27T09:54:59","date_gmt":"2017-10-27T00:54:59","guid":{"rendered":"https:\/\/www.jpu.or.jp\/eng\/?p=6039"},"modified":"2018-06-09T16:36:03","modified_gmt":"2018-06-09T07:36:03","slug":"slip-finder","status":"publish","type":"post","link":"https:\/\/www.jpu.or.jp\/eng\/slip-finder\/","title":{"rendered":"Slip Finder"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":5,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[50],"tags":[],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.8 - aioseo.com -->\n\t<meta name=\"description\" content=\"YIS-50HM (High Magnification MM) is a part of SLIP FINDER SYSTEM to detect slip lines on EPI wafers. Automated slip detection is performed by our proprietary software. 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