{"id":5975,"date":"2017-10-26T18:49:16","date_gmt":"2017-10-26T09:49:16","guid":{"rendered":"https:\/\/www.jpu.or.jp\/eng\/?p=5975"},"modified":"2018-06-09T16:39:22","modified_gmt":"2018-06-09T07:39:22","slug":"ys-100sp-300sp","status":"publish","type":"post","link":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/","title":{"rendered":"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP"},"content":{"rendered":"","protected":false},"excerpt":{"rendered":"","protected":false},"author":5,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[50],"tags":[],"class_list":["post-5975","post","type-post","status-publish","format-standard","hentry","category-yamashita","product_cat-optical-measurement"],"acf":[],"aioseo_notices":[],"aioseo_head":"\n\t\t<!-- All in One SEO 4.9.10 - aioseo.com -->\n\t<meta name=\"description\" content=\"This is the well known technology, called as &quot;Magic Mirror&quot; or &quot;Makyo Inspection system&quot; to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.\" \/>\n\t<meta name=\"robots\" content=\"max-image-preview:large\" \/>\n\t<meta name=\"author\" content=\"jpu_us_admin\"\/>\n\t<link rel=\"canonical\" href=\"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/\" \/>\n\t<meta name=\"generator\" content=\"All in One SEO (AIOSEO) 4.9.10\" \/>\n\t\t<meta property=\"og:locale\" content=\"ja_JP\" \/>\n\t\t<meta property=\"og:site_name\" content=\"Japan Products Union | Development of Japanese manufacturing companies through cooperation. \uff5cJapan Products Union\" \/>\n\t\t<meta property=\"og:type\" content=\"article\" \/>\n\t\t<meta property=\"og:title\" content=\"Mirror Surface Inspection System&quot;MAKYO&quot; YS-100SP to 300SP | Japan Products Union\" \/>\n\t\t<meta property=\"og:description\" content=\"This is the well known technology, called as &quot;Magic Mirror&quot; or &quot;Makyo Inspection system&quot; to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.\" \/>\n\t\t<meta property=\"og:url\" content=\"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/\" \/>\n\t\t<meta property=\"article:published_time\" content=\"2017-10-26T09:49:16+00:00\" \/>\n\t\t<meta property=\"article:modified_time\" content=\"2018-06-09T07:39:22+00:00\" \/>\n\t\t<meta name=\"twitter:card\" content=\"summary\" \/>\n\t\t<meta name=\"twitter:title\" content=\"Mirror Surface Inspection System&quot;MAKYO&quot; YS-100SP to 300SP | Japan Products Union\" \/>\n\t\t<meta name=\"twitter:description\" content=\"This is the well known technology, called as &quot;Magic Mirror&quot; or &quot;Makyo Inspection system&quot; to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.\" \/>\n\t\t<script type=\"application\/ld+json\" class=\"aioseo-schema\">\n\t\t\t{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#article\",\"name\":\"Mirror Surface Inspection System\\\"MAKYO\\\" YS-100SP to 300SP | Japan Products Union\",\"headline\":\"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP\",\"author\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/author\\\/jpu_us_admin\\\/#author\"},\"publisher\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/#organization\"},\"datePublished\":\"2017-10-26T18:49:16+09:00\",\"dateModified\":\"2018-06-09T16:39:22+09:00\",\"inLanguage\":\"ja\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#webpage\"},\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#webpage\"},\"articleSection\":\"Yamashita Denso Corporation, optical-measurement\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#breadcrumblist\",\"itemListElement\":[{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng#listItem\",\"position\":1,\"name\":\"\\u30db\\u30fc\\u30e0\",\"item\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\",\"nextItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/category\\\/yamashita\\\/#listItem\",\"name\":\"Yamashita Denso Corporation\"}},{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/category\\\/yamashita\\\/#listItem\",\"position\":2,\"name\":\"Yamashita Denso Corporation\",\"item\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/category\\\/yamashita\\\/\",\"nextItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#listItem\",\"name\":\"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP\"},\"previousItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng#listItem\",\"name\":\"\\u30db\\u30fc\\u30e0\"}},{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#listItem\",\"position\":3,\"name\":\"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP\",\"previousItem\":{\"@type\":\"ListItem\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/category\\\/yamashita\\\/#listItem\",\"name\":\"Yamashita Denso Corporation\"}}]},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/#organization\",\"name\":\"Japan Products Union\",\"description\":\"Development of Japanese manufacturing companies through cooperation. \\uff5cJapan Products Union\",\"url\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/\"},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/author\\\/jpu_us_admin\\\/#author\",\"url\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/author\\\/jpu_us_admin\\\/\",\"name\":\"jpu_us_admin\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#webpage\",\"url\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/\",\"name\":\"Mirror Surface Inspection System\\\"MAKYO\\\" YS-100SP to 300SP | Japan Products Union\",\"description\":\"This is the well known technology, called as \\\"Magic Mirror\\\" or \\\"Makyo Inspection system\\\" to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.\",\"inLanguage\":\"ja\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/#website\"},\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/ys-100sp-300sp\\\/#breadcrumblist\"},\"author\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/author\\\/jpu_us_admin\\\/#author\"},\"creator\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/author\\\/jpu_us_admin\\\/#author\"},\"datePublished\":\"2017-10-26T18:49:16+09:00\",\"dateModified\":\"2018-06-09T16:39:22+09:00\"},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/#website\",\"url\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/\",\"name\":\"Japan Products Union\",\"description\":\"Development of Japanese manufacturing companies through cooperation. \\uff5cJapan Products Union\",\"inLanguage\":\"ja\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.jpu.or.jp\\\/eng\\\/#organization\"}}]}\n\t\t<\/script>\n\t\t<!-- All in One SEO -->\n\n","aioseo_head_json":{"title":"Mirror Surface Inspection System\"MAKYO\" YS-100SP to 300SP | Japan Products Union","description":"This is the well known technology, called as \"Magic Mirror\" or \"Makyo Inspection system\" to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.","canonical_url":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/","robots":"max-image-preview:large","keywords":"","webmasterTools":{"miscellaneous":""},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#article","name":"Mirror Surface Inspection System\"MAKYO\" YS-100SP to 300SP | Japan Products Union","headline":"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP","author":{"@id":"https:\/\/www.jpu.or.jp\/eng\/author\/jpu_us_admin\/#author"},"publisher":{"@id":"https:\/\/www.jpu.or.jp\/eng\/#organization"},"datePublished":"2017-10-26T18:49:16+09:00","dateModified":"2018-06-09T16:39:22+09:00","inLanguage":"ja","mainEntityOfPage":{"@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#webpage"},"isPartOf":{"@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#webpage"},"articleSection":"Yamashita Denso Corporation, optical-measurement"},{"@type":"BreadcrumbList","@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#breadcrumblist","itemListElement":[{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng#listItem","position":1,"name":"\u30db\u30fc\u30e0","item":"https:\/\/www.jpu.or.jp\/eng","nextItem":{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng\/category\/yamashita\/#listItem","name":"Yamashita Denso Corporation"}},{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng\/category\/yamashita\/#listItem","position":2,"name":"Yamashita Denso Corporation","item":"https:\/\/www.jpu.or.jp\/eng\/category\/yamashita\/","nextItem":{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#listItem","name":"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP"},"previousItem":{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng#listItem","name":"\u30db\u30fc\u30e0"}},{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#listItem","position":3,"name":"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP","previousItem":{"@type":"ListItem","@id":"https:\/\/www.jpu.or.jp\/eng\/category\/yamashita\/#listItem","name":"Yamashita Denso Corporation"}}]},{"@type":"Organization","@id":"https:\/\/www.jpu.or.jp\/eng\/#organization","name":"Japan Products Union","description":"Development of Japanese manufacturing companies through cooperation. \uff5cJapan Products Union","url":"https:\/\/www.jpu.or.jp\/eng\/"},{"@type":"Person","@id":"https:\/\/www.jpu.or.jp\/eng\/author\/jpu_us_admin\/#author","url":"https:\/\/www.jpu.or.jp\/eng\/author\/jpu_us_admin\/","name":"jpu_us_admin"},{"@type":"WebPage","@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#webpage","url":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/","name":"Mirror Surface Inspection System\"MAKYO\" YS-100SP to 300SP | Japan Products Union","description":"This is the well known technology, called as \"Magic Mirror\" or \"Makyo Inspection system\" to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.","inLanguage":"ja","isPartOf":{"@id":"https:\/\/www.jpu.or.jp\/eng\/#website"},"breadcrumb":{"@id":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/#breadcrumblist"},"author":{"@id":"https:\/\/www.jpu.or.jp\/eng\/author\/jpu_us_admin\/#author"},"creator":{"@id":"https:\/\/www.jpu.or.jp\/eng\/author\/jpu_us_admin\/#author"},"datePublished":"2017-10-26T18:49:16+09:00","dateModified":"2018-06-09T16:39:22+09:00"},{"@type":"WebSite","@id":"https:\/\/www.jpu.or.jp\/eng\/#website","url":"https:\/\/www.jpu.or.jp\/eng\/","name":"Japan Products Union","description":"Development of Japanese manufacturing companies through cooperation. \uff5cJapan Products Union","inLanguage":"ja","publisher":{"@id":"https:\/\/www.jpu.or.jp\/eng\/#organization"}}]},"og:locale":"ja_JP","og:site_name":"Japan Products Union | Development of Japanese manufacturing companies through cooperation. \uff5cJapan Products Union","og:type":"article","og:title":"Mirror Surface Inspection System&quot;MAKYO&quot; YS-100SP to 300SP | Japan Products Union","og:description":"This is the well known technology, called as &quot;Magic Mirror&quot; or &quot;Makyo Inspection system&quot; to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options.","og:url":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/","article:published_time":"2017-10-26T09:49:16+00:00","article:modified_time":"2018-06-09T07:39:22+00:00","twitter:card":"summary","twitter:title":"Mirror Surface Inspection System&quot;MAKYO&quot; YS-100SP to 300SP | Japan Products Union","twitter:description":"This is the well known technology, called as &quot;Magic Mirror&quot; or &quot;Makyo Inspection system&quot; to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others. Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such as automated damage inspection software and printer options."},"aioseo_meta_data":{"post_id":"5975","title":"Mirror Surface Inspection System&quot;MAKYO&quot; YS-100SP to 300SP | #site_title","description":"This is the well known technology, called as &quot;Magic Mirror&quot; or &quot;Makyo Inspection system&quot; to be able to inspect semiconductor wafer surface for latent damages. Non-contact and non-destructive test method. It can be used for Si Wafer, GaAs wafer, Polished flat Glass surface, Sapphire wafer, semi-transparent wafer surface, polished metal surface and many others.  Optics requires no maintenance and lamp has to be replaced for a maintenance. Other options, such  as automated damage inspection software and printer options.","keywords":null,"keyphrases":null,"primary_term":null,"canonical_url":null,"og_title":null,"og_description":null,"og_object_type":"default","og_image_type":"default","og_image_url":null,"og_image_width":null,"og_image_height":null,"og_image_custom_url":null,"og_image_custom_fields":null,"og_video":null,"og_custom_url":null,"og_article_section":null,"og_article_tags":null,"twitter_use_og":false,"twitter_card":"default","twitter_image_type":"default","twitter_image_url":null,"twitter_image_custom_url":null,"twitter_image_custom_fields":null,"twitter_title":null,"twitter_description":null,"schema":{"blockGraphs":[],"customGraphs":[],"default":{"data":{"Article":[],"Course":[],"Dataset":[],"FAQPage":[],"Movie":[],"Person":[],"Product":[],"ProductReview":[],"Car":[],"Recipe":[],"Service":[],"SoftwareApplication":[],"WebPage":[]},"graphName":"","isEnabled":true},"graphs":[]},"schema_type":null,"schema_type_options":null,"pillar_content":false,"robots_default":true,"robots_noindex":false,"robots_noarchive":false,"robots_nosnippet":false,"robots_nofollow":false,"robots_noimageindex":false,"robots_noodp":false,"robots_notranslate":false,"robots_max_snippet":null,"robots_max_videopreview":null,"robots_max_imagepreview":"large","priority":null,"frequency":null,"local_seo":null,"breadcrumb_settings":null,"limit_modified_date":false,"ai":null,"created":"2021-08-20 19:23:59","updated":"2025-06-04 03:10:00","seo_analyzer_scan_date":null},"aioseo_breadcrumb":"<div class=\"aioseo-breadcrumbs\"><span class=\"aioseo-breadcrumb\">\n\t\t\t<a href=\"https:\/\/www.jpu.or.jp\/eng\" title=\"\u30db\u30fc\u30e0\">\u30db\u30fc\u30e0<\/a>\n\t\t<\/span><span class=\"aioseo-breadcrumb-separator\">&raquo;<\/span><span class=\"aioseo-breadcrumb\">\n\t\t\t<a href=\"https:\/\/www.jpu.or.jp\/eng\/category\/yamashita\/\" title=\"Yamashita Denso Corporation\">Yamashita Denso Corporation<\/a>\n\t\t<\/span><span class=\"aioseo-breadcrumb-separator\">&raquo;<\/span><span class=\"aioseo-breadcrumb\">\n\t\t\tMirror Surface Inspection System\u201dMAKYO\u201d  YS-100SP to 300SP\n\t\t<\/span><\/div>","aioseo_breadcrumb_json":[{"label":"\u30db\u30fc\u30e0","link":"https:\/\/www.jpu.or.jp\/eng"},{"label":"Yamashita Denso Corporation","link":"https:\/\/www.jpu.or.jp\/eng\/category\/yamashita\/"},{"label":"Mirror Surface Inspection System&#8221;MAKYO&#8221;  YS-100SP to 300SP","link":"https:\/\/www.jpu.or.jp\/eng\/ys-100sp-300sp\/"}],"_links":{"self":[{"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/posts\/5975","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/users\/5"}],"replies":[{"embeddable":true,"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/comments?post=5975"}],"version-history":[{"count":3,"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/posts\/5975\/revisions"}],"predecessor-version":[{"id":6812,"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/posts\/5975\/revisions\/6812"}],"wp:attachment":[{"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/media?parent=5975"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/categories?post=5975"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.jpu.or.jp\/eng\/wp-json\/wp\/v2\/tags?post=5975"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}